Interconnect Materials Database

Search the visualization below for various properties of topological interconnect materials described in
Tyner et al. Accelerated Discovery of Topological Conductors for Nanoscale Interconnects (2025)

Scatter plot of 3,000 screened compound-surface-direction combinations. Each point is labeled by its maximal surface transmission ( $T_S$ ), surface energy ( $\gamma$ ), and Fermi level shift ( $\Delta E_F$ ). Points are colored by ${\eta} = (\Delta E_F^2 + \gamma^2 + R_S^{2})^{1/2}$ , with $R_S=T_S^{-1}$ , where lower values indicate optimal interconnect candidates. Additional data available on Dryad.

Please cite our paper, Tyner et al. (2025), where additional details may be found.

Portions of this work were was supported by the SUPeRior Energy-efficient Materials and dEvices (SUPREME) Center SUPREME, one of seven centers in the JUMP 2.0, a Semiconductor Research Corporation (SRC) program sponsored by DARPA. The views and opinions of authors expressed herein do not necessarily state or reflect those of the United States Government or any agency thereof.

Interconnect Materials Database

Search the visualization below for various properties of topological interconnect materials described inTyner et al. Accelerated Discovery of Topological Conductors for Nanoscale Interconnects (2025)

Please cite our paper, Tyner et al. (2025), where additional details may be found.

Search the visualization below for various properties of topological interconnect materials described in
Tyner et al. Accelerated Discovery of Topological Conductors for Nanoscale Interconnects (2025)